Understanding Device Performance Limiting Factors by Reproducing The Current-Voltage Characteristics from Transient Optoelectrical Measurements
Abasi Abudulimu(Astronomy and Space), Randy J. Ellingson(National Laboratory of the Rockies), İmge Namal(University of Würzburg), Mirella El Gemayel(Centre National de la Recherche Scientifique), Klaus H. Eckstein(University of Würzburg), Sebastian B Meier(Madrid Institute for Advanced Studies), Michael J. Heben(University of Toledo), Tobias Hertel(Vanderbilt University), Larry Lüer(IMDEA Nanoscience)
2022 IEEE 49th Photovoltaics Specialists Conference (PVSC)
June 5, 2022
Cited by 0
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