Noise-robust machinery fault diagnosis based on self-attention mechanism in wavelet domain

Aosheng Tian(National University of Defense Technology), Shilin Zhou(National University of Defense Technology), Huiling Chen(Wenzhou University), Chao Ma, Weidong Sheng(National University of Defense Technology), Ye Zhang(National University of Defense Technology)
Measurement
December 10, 2022
Cited by 52


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