Study on filament width of type-I ELM in EAST using VUV imaging system and simulation
Tingfeng Ming(Chinese Academy of Sciences), Xiang Gao(Chinese Academy of Sciences), Q. Q. Shi(University of Science and Technology of China), Feifei Long(Shenzhen University), G.Q. Li(Chinese Academy of Sciences), Qing Zang(Chinese Academy of Sciences), X.J. Zhang(Chinese Academy of Sciences), Xiang Zhu(Chinese Academy of Sciences), Ruyuan Deng(Hangzhou Dianzi University), Songxue Hou(Anhui University), Baolong Hao(Shenzhen University), Hang Li(Shenzhen University), H. Lian(Chinese Academy of Sciences), Bing Li(Chinese Academy of Sciences), X.H. Wu(Chinese Academy of Sciences), Tianyang Xia(Chinese Academy of Sciences), Haiqing Liu(Shanghai Jiao Tong University), Muquan Wu(Hefei University of Technology), Hongcheng Fan(Chinese Academy of Sciences), Tengfei Tang(Shihezi University)
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