Revealing multi-stage growth mechanism of Kirkendall voids at electrode interfaces of Bi2Te3-based thermoelectric devices with in-situ TEM technique
Yangjian Lin(Anhui University), Binghui Ge(Anhui University), Feng Cheng(Anhui University), Weishu Liu(Boston College), Xinzhi Wu(Southern University of Science and Technology), Yuchen Li(Beijing Institute of Graphic Communication)
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