Revealing multi-stage growth mechanism of Kirkendall voids at electrode interfaces of Bi2Te3-based thermoelectric devices with in-situ TEM technique
Yangjian Lin(Anhui University), Binghui Ge(Anhui University), Feng Cheng(Ningbo University), Weishu Liu(Southern University of Science and Technology), Xinzhi Wu(National Institute for Materials Science), Yuchen Li(Beijing Institute of Graphic Communication)
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