Radius measurement via super-resolution microscopy enables the development of a variable radii proximity labeling platform

James V. Oakley(Princeton University), David W. C. MacMillan(Princeton University), Gregory D. Scholes(Princeton University), Ciaran P. Seath(Princeton University), Jacob B. Geri(Princeton University), David F. Fernández(Princeton University), Benito F. Buksh(Princeton University), Daniel G. Oblinsky(Princeton University)
Proceedings of the National Academy of Sciences
August 1, 2022
Cited by 117


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