Investigation of Chalcogenide Perovskite Thin Films Using Scanning Transmission Electron Microscopy (STEM)

Michael Xu(Massachusetts Institute of Technology), James M. LeBeau(Massachusetts Institute of Technology), Ida Sadeghi(Massachusetts Institute of Technology), Kevin Ye(Massachusetts Institute of Technology), Rafael Jaramillo(Paul Drude Institute for Solid State Electronics)
Microscopy and Microanalysis
July 22, 2022
Cited by 5


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