Preface for the special topic collection honoring Dr. Scott Chambers’ 70th birthday and his leadership in the science and technology of oxide thin films
Tiffany C. Kaspar(Pacific Northwest National Laboratory), Joseph H. Ngai(The University of Texas at Arlington), Yingge Du(Pacific Northwest National Laboratory), Bharat Jalan(University of Minnesota), Donald R. Baer(Pacific Northwest National Laboratory), Mark Engelhard(Pacific Northwest National Laboratory)
Cited by 0
Related Papers
Experimental determination of valence band maxima for SrTiO3, TiO2, and SrO and the associated valence band offsets with Si(001)
|Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena|2004|282
XPS guide: Charge neutralization and binding energy referencing for insulating samples
|Journal of Vacuum Science & Technology A Vacuum Surfaces and Films|2020|262
Spectroscopic Evidence for Ag(III) in Highly Oxidized Silver Films by X-ray Photoelectron Spectroscopy
|The Journal of Physical Chemistry C|2010|248
Electronic and Defect Structures of CuSCN
|The Journal of Physical Chemistry C|2010|188