Investigation of Thermally Induced Threshold Voltage Shift in Normally-OFF p-GaN Gate HEMTs
Huan Wang(Anhui University), Wenping Cao(Shanghai Jiao Tong University), Xi Tang(Anhui University), Ming Jiang(Anhui University), Wei Gan(Anhui University), Yan Lin(Shenzhen University), Fengwei Ji(Anhui University), Maojun Wang(Peking University), Junsong Jiang(Anhui University), Meng Zhang(Shenzhen University), Hui Li(Southern Illinois University Carbondale), Jin Wei(Peking University), Cungang Hu(Anhui University), Dan Dong(Shenzhen University), Baikui Li
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