Digital holography as metrology tool at micro-nanoscale for soft matter
Zhe Wang(Tsinghua University), Pietro Ferraro(TomTom (Netherlands)), Lisa Miccio(National Institute of Optics), Pasquale Memmolo(Institute of Applied Science and Intelligent Systems), Sara Coppola(National Institute of Optics), Ernesto Di Maio(University of Naples Federico II), Vittorio Bianco(Institute of Applied Science and Intelligent Systems), Pier Luca Maffettone(University of Naples Federico II), V. C. A. Ferraro(University of Naples Federico II), Volodymyr Tkachenko(Institute of Applied Science and Intelligent Systems)
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