Digital holography as metrology tool at micro-nanoscale for soft matter
Zhe Wang, Pietro Ferraro(National Research Council), Lisa Miccio(Institute of Applied Science and Intelligent Systems), Pasquale Memmolo(Institute of Applied Science and Intelligent Systems), Sara Coppola(National Institute of Optics), Ernesto Di Maio(University of Naples Federico II), Vittorio Bianco(Institute of Applied Science and Intelligent Systems), Pier Luca Maffettone, V. C. A. Ferraro(University of Naples Federico II), Volodymyr Tkachenko(Institute of Applied Science and Intelligent Systems)
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