A Unified PUF and TRNG Design Based on 40-nm RRAM With High Entropy and Robustness for IoT Security

Bin Gao(Chinese Academy of Sciences), Huaqiang Wu(Beijing Advanced Sciences and Innovation Center), Jianshi Tang(Tsinghua University), Bohan Lin(Tsinghua University), Xueqi Li(Tsinghua University), He Qian(University of Science and Technology of China)
IEEE Transactions on Electron Devices
January 10, 2022
Cited by 67


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