Investigation of Resistive Switching Mechanisms in Ti/TiO<i><sub>x</sub></i>/Pd‐Based RRAM Devices

Ruofei Hu(Hubei University), Huaqiang Wu(Beijing Advanced Sciences and Innovation Center), Xiaojian Zheng(Tsinghua University), Jianshi Tang(Tsinghua University), Yijun Li(Institute of Microelectronics), He Qian(University of Science and Technology of China), Xinyi Li(Institute of Microelectronics), Bin Gao(Chinese Academy of Sciences)
Advanced Electronic Materials
December 30, 2021
10.1002/aelm.202100827
Cited by 31

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