An Improved Capsule Network (WaferCaps) for Wafer Bin Map Classification Based on DCGAN Data Upsampling

Abd Al Rahman M. Abu Ebayyeh(Brunel University of London), Alireza Mousavi(Brunel University of London), Sebelan Danishvar(Brunel University of London)
IEEE Transactions on Semiconductor Manufacturing
December 10, 2021
Cited by 32


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