Unsupervised Anomaly Detection in Printed Circuit Boards through Student–Teacher Feature Pyramid Matching

Abstract

Deep learning methods are currently used in industries to improve the efficiency and quality of the product. Detecting defects on printed circuit boards (PCBs) is a challenging task and is usually solved by automated visual inspection, automated optical inspection, manual inspection, and supervised learning methods, such as you only look once (YOLO) of tiny YOLO, YOLOv2, YOLOv3, YOLOv4, and YOLOv5. Previously described methods for defect detection in PCBs require large numbers of labeled images, which is computationally expensive in training and requires a great deal of human effort to label the data. This paper introduces a new unsupervised learning method for the detection of defects in PCB using student–teacher feature pyramid matching as a pre-trained image classification model used to learn the distribution of images without anomalies. Hence, we extracted the knowledge into a student network which had same architecture as the teacher network. This one-step transfer retains key clues as much as possible. In addition, we incorporated a multi-scale feature matching strategy into the framework. A mixture of multi-level knowledge from the features pyramid passes through a better supervision, known as hierarchical feature alignment, which allows the student network to receive it, thereby allowing for the detection of various sizes of anomalies. A scoring function reflects the probability of the occurrence of anomalies. This framework helped us to achieve accurate anomaly detection. Apart from accuracy, its inference speed also reached around 100 frames per second.