The Simulation of Increasing Robustness of High Voltage Fast Recovery Diode used in VSC-HVDC Equipments

Feng He(Southern University of Science and Technology), Junmin Wu(State Grid Corporation of China (China)), Shaohua Dong(Applied Photonics (United Kingdom)), Yueyang Liu(State Grid Corporation of China (China)), Yaohua Wang(State Grid Corporation of China (China)), Li Cui(State Grid Corporation of China (China)), Rui Jin(Imperial College London)
Unknown
June 1, 2021
10.1109/isctis51085.2021.00062
Cited by 1

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