A Janovec‐Kay‐Dunn‐Like Behavior at Thickness Scaling in Ultra‐Thin Antiferroelectric ZrO<sub>2</sub> Films (Adv. Electron. Mater. 11/2021)
Nujhat Tasneem(Georgia Institute of Technology), Asif Islam Khan(Georgia Institute of Technology), Yasmin Mohamed Yousry(German University in Cairo), Nazanin Bassiri‐Gharb(Georgia Institute of Technology), Mengkun Tian(Georgia Institute of Technology), Sebastian E. Reyes‐Lillo(Universidad Andrés Bello), Josh Kacher(Georgia Institute of Technology), Milan Dopita(Charles University)
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