Simultaneously improving the resolving power and sensitivity for planar high‐field asymmetric waveform ion mobility spectrometry using a mixed gas inlet mode at two ends
Wei Zi(Guilin University of Aerospace Technology), Hua Li(Guilin University of Technology), Wenxiang Xiao(Guilin University of Electronic Technology), Zhencheng Chen(Guangxi University), Hongda Zeng(Guilin University of Electronic Technology), Xiaoxia Du(Guilin University of Electronic Technology)
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