Remote Online Two-Step Stress Lifetime Acceleration Test System for Ultraviolet Light-Emitting Diodes

Lihong Zhu(Xiamen University), Yijun Lü(Xiamen University), Weijie Guo(Xiamen University), Tingzhu Wu(Xiamen University), Zhong Chen(Xiamen University), Yu-Jiao Ruan, Ziquan Guo(Xiamen University), Yue Lin(Xiamen University), Qiu-Wei Zheng(Xiamen University)
IEEE Transactions on Instrumentation and Measurement
January 1, 2021
Cited by 9


Related Papers