Crossbar-Level Retention Characterization in Analog RRAM Array-Based Computation-in-Memory System

Meiran Zhao(Institute of Microelectronics), Huaqiang Wu(Beijing Advanced Sciences and Innovation Center), Qingtian Zhang(Tsinghua University), Peng Yao(Tsinghua University), He Qian(University of Science and Technology of China), Jianshi Tang(Tsinghua University), Ying Zhou(Institute of Microelectronics), Bin Gao(Chinese Academy of Sciences)
IEEE Transactions on Electron Devices
June 23, 2021
Cited by 13


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