Unraveling the degradation process of 2D passivated and Cs stabilized FAPbI<sub>3</sub> by optical pump THz probe spectroscopy
Hao Sun(China Telecom (China)), Yalin Lu(Beijing Jiaotong University), Hongchuan He(University of Science and Technology of China), Qiuping Huang(University of Science and Technology of China), Xiaoxia Lin(University of Science and Technology of China), Ming Yin(Hunan Normal University), Hao Cheng(Beijing University of Posts and Telecommunications)
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