Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization With Neutrons and Alpha Particles
Takashi Kato(Socionext (Japan)), Yasuhiro Miyake(High Energy Accelerator Research Organization), Soshi Takeshita(High Energy Accelerator Research Organization), Masanori Hashimoto(The University of Osaka), Hiroki Tanaka(Kyoto University), M. Tampo(Kansai Institute for Photon Science), Hideya Matsuyama(Socionext (Japan))
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