Continuous In-Line Chromium Coating Thickness Measurement Methodologies: An Investigation of Current and Potential TechnologyAdam Jones(University of South Wales), Nigel Copner(University of South Wales)SensorsMay 11, 202110.3390/s21103340Cited by 15SaveCiteExport RISWatch citationsRelated PapersComparative study of passively Q-switched c-cut Nd:YVO 4 /Nd:YAG lasers based on CVD graphene and controlled operation|Optics Communications|2016|0