Compact Reliability Model of Analog RRAM for Computation-in-Memory Device-to-System Codesign and Benchmark

Yuyi Liu(Hainan University), Huaqiang Wu(Beijing Advanced Sciences and Innovation Center), Feng Xu(Tsinghua University), Meiran Zhao(Institute of Microelectronics), Yue Xi(Tsinghua University), Qingtian Zhang(Tsinghua University), Peng Yao(Tsinghua University), Siyao Yang(Tsinghua University), Wenqiang Zhang(Tsinghua University), He Qian(University of Science and Technology of China), Jianshi Tang(Tsinghua University), Ruofei Hu(Hubei University), Bin Gao(Chinese Academy of Sciences)
IEEE Transactions on Electron Devices
April 8, 2021
Cited by 15


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