The significance of the spectral correction of photon counting detector response in material classification from spectral x-ray CT
Doniyor Jumanazarov(Accent Pro 2000 (Romania)), M. Iovea(Accent Pro 2000 (Romania)), Jakeoung Koo(Gachon University), Ulrik L. Olsen(Technical University of Denmark), Henning Friis Poulsen(Technical University of Denmark)
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