Operational Lifetime–Stress Model for Complex Networks
Shu Guo(China Electronic Product Reliability and Environmental Test Institute), Daqing Li(Queen Mary University of London), Jilong Zhong(Jiangxi University of Science and Technology), Shunkun Yang(Daegu Catholic University), Yi Ding(Purdue University West Lafayette), Dong Zhou(Beihang University), Rui Kang(Zhejiang International Studies University)
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