Bulk and Short‐Circuit Anion Diffusion in Epitaxial Fe<sub>2</sub>O<sub>3</sub> Films Quantified Using Buried Isotopic Tracer Layers
Tiffany C. Kaspar(Pacific Northwest National Laboratory), Daniel K. Schreiber(Pacific Northwest National Laboratory), Zihua Zhu(Pacific Northwest National Laboratory), Steven R. Spurgeon(National Laboratory of the Rockies), Aaron A. Kohnert(Los Alamos National Laboratory), Yadong Zhou(Pacific Northwest National Laboratory), Evan K. Still(University of California, Berkeley), Peter Hosemann(University of California, Berkeley), Sandra D. Taylor(Pacific Northwest National Laboratory), Kayla Yano(Pacific Northwest National Laboratory), Timothy G. Lach(Pacific Northwest National Laboratory)
Cited by 18
Related Papers
Experimental determination of valence band maxima for SrTiO3, TiO2, and SrO and the associated valence band offsets with Si(001)
|Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena|2004|282
Spectroscopic Evidence for Ag(III) in Highly Oxidized Silver Films by X-ray Photoelectron Spectroscopy
|The Journal of Physical Chemistry C|2010|248
Electronic and Defect Structures of CuSCN
|The Journal of Physical Chemistry C|2010|188
Hidden ferromagnetic secondary phases in cobalt-doped ZnO epitaxial thin films
|Physical Review B|2008|174