Effects of x-ray scatter in quantitative dual-energy imaging using dual-layer flat panel detectors
Chumin Zhao(Johns Hopkins University), Wojciech Zbijewski(Johns Hopkins University), S. Kappler(Radboud University Nijmegen), Stephen Z. Liu(Johns Hopkins University), Ludwig Ritschl(Siemens Healthineers (Germany)), J. Webster Stayman(Johns Hopkins University), Magdalena Herbst(Siemens Healthineers (Germany)), Jeffrey H. Siewerdsen(Johns Hopkins University), Thomas Weber(Siemens Healthineers (Germany)), Wenying Wang(Inner Mongolia Agricultural University), Sebastian Vogt(Siemens Healthineers (Germany))
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