Effects of x-ray scatter in quantitative dual-energy imaging using dual-layer flat panel detectors
Chumin Zhao(United States Food and Drug Administration), Wojciech Zbijewski(Johns Hopkins University), S. Kappler(Radboud University Nijmegen), Stephen Z. Liu(Johns Hopkins University), Ludwig Ritschl(Siemens Healthineers (Germany)), J. Webster Stayman(Johns Hopkins University), Magdalena Herbst(Siemens Healthineers (Germany)), Jeffrey H. Siewerdsen(The University of Texas MD Anderson Cancer Center), Thomas Weber(Siemens Healthineers (Germany)), Wenying Wang(Army Medical University), Sebastian Vogt(Siemens Healthineers (Germany))
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