Millimeter-Wave Radar Sensor for Automated Tomographic Imaging of Composite Materials in a Manufacturing Environment
Dominik Meier(Fraunhofer Institute for Applied Solid State Physics), Leonhard Reindl(University of Freiburg), Benjamin Baumann(Jensen Hughes (United States)), Bersant Gashi(Fraunhofer Institute for Applied Solid State Physics), Jutta Kühn(Fraunhofer Institute for Applied Solid State Physics), Matthias Malzacher(Fraunhofer Institute for Applied Solid State Physics), M. Schlechtweg(Carl von Ossietzky Universität Oldenburg), Markus Rösch(ETH Zurich), Christian Zech(Fraunhofer Institute for Applied Solid State Physics)
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