A Highly Reliable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source

Bohan Lin(Tsinghua University), Huaqiang Wu(Beijing Advanced Sciences and Innovation Center), Meng‐Fan Chang(Taiwan Semiconductor Manufacturing Company (Taiwan)), Shimeng Yu(Georgia Institute of Technology), Xiaoyu Sun(Georgia Institute of Technology), He Qian(University of Science and Technology of China), Yachuan Pang(Tsinghua University), Dong Wu(Tsinghua University), Ting-Wei Chang(National Taiwan University), Jianshi Tang(Tsinghua University), Wei-En Lin(National Tsing Hua University), Bin Gao(Chinese Academy of Sciences)
IEEE Journal of Solid-State Circuits
January 20, 2021
Cited by 66


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