Combining X-Ray Thomson Scattering and X-Ray Raman Spectroscopy to Characterize Solid-Density Plasmas

D. Kraus(Helmholtz-Zentrum Dresden-Rossendorf), U. Zastrau(European X-Ray Free-Electron Laser), Jan Vorberger(Helmholtz-Zentrum Dresden-Rossendorf), T. Toncian(Heinrich Heine University Düsseldorf), K. Falk(Los Alamos National Laboratory), Deniza Chekrygina(Helmholtz-Zentrum Dresden-Rossendorf), Mikako Makita(European X-Ray Free-Electron Laser), Michal Šmíd(Helmholtz-Zentrum Dresden-Rossendorf), Thomas R. Preston(European X-Ray Free-Electron Laser), Karen Appel(European X-Ray Free-Electron Laser), R. W. Falcone(University of California, Berkeley), Kushal Ramakrishna(Helmholtz-Zentrum Dresden-Rossendorf), K. Voigt(Helmholtz-Zentrum Dresden-Rossendorf), Bob Nagler(SLAC National Accelerator Laboratory), Hae Ja Lee(SLAC National Accelerator Laboratory), A. Pełka(École Polytechnique), M. Harmand(Inserm), Alexis Amouretti(The University of Osaka), Stefan P. Hau‐Riege(Lawrence Livermore National Laboratory), Min Zhang, Luke Fletcher, T. Doeppner(Population Health Research Institute), N. J. Hartley(Helmholtz-Zentrum Dresden-Rossendorf), Anja Schuster(Helmholtz-Zentrum Dresden-Rossendorf), Lingen Huang(Helmholtz-Zentrum Dresden-Rossendorf)

Bulletin of the American Physical Society

November 12, 2020

Cited by 0

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