Insulin Resistance at the Crossroad of Alzheimer Disease Pathology: A Review
Jorge Berlanga‐Acosta(Centro de Ingeniería Genética y Biotecnología), Pedro A. Valdés‐Sosa(University of Electronic Science and Technology of China), María L. Bringas-Vega(University of Electronic Science and Technology of China), Diana García-del-Barco-Herrera(Centro de Ingeniería Genética y Biotecnología), Gerardo Guillén(Hunan City University), Jorge O. Berlanga-Saez(Universidade Federal do Rio de Janeiro), Nadia Rodríguez-Rodríguez(Centro de Ingeniería Genética y Biotecnología), Mitchell Joseph Valdés-Sosa(University of Electronic Science and Technology of China), Ariana García‐Ojalvo(Centro de Ingeniería Genética y Biotecnología)
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