Role of defects and grain boundaries in the thermal response of wafer-scale hBN films
Kousik Bera(Indian Institute of Technology Kharagpur), C. Jagadish(Australian National University), J. Wong‐Leung(Australian National University), Anushree Roy(Indian Institute of Technology Kharagpur), Hark Hoe Tan(Australian National University), Dipankar Chugh(Australian National University)
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