Aberration correction method for Fourier ptychographic microscopy based on neural network
Jinlei Zhang(Suzhou University of Science and Technology), Zhenrong Zheng(Shanghai Optical Instrument Research Institute), Chenning Tao(Zhejiang Normal University), Peng Sun(Zhejiang University), Xiao Ming Tao(State Key Laboratory of Modern Optical Instruments), Chang Wang(Zhejiang University), Zhanghao Ding(State Key Laboratory of Modern Optical Instruments)
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