Quantitative STEM Imaging and Multislice Simulation of Stacking Fault Defects for Exciton Trapping in GaAs
Steven R. Spurgeon(National Laboratory of the Rockies), Kai‐Mei C. Fu(University of Washington), Andreas D. Wieck(University of Duisburg-Essen), M. M. Glazov(National Institute for Materials Science), M. V. Durnev(Ioffe Institute), Maria Viitaniemi(University of Washington), Peter V. Sushko(Pacific Northwest National Laboratory), Xiayu Linpeng(Southern University of Science and Technology), Bethany E. Matthews(Pacific Northwest National Laboratory), Arne Ludwig(Ruhr University Bochum)
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