System-independent material classification through X-ray attenuation decomposition from spectral X-ray CT
Doniyor Jumanazarov(Accent Pro 2000 (Romania)), M. Iovea(Accent Pro 2000 (Romania)), Matteo Busi(Paul Scherrer Institute), Jakeoung Koo(Gachon University), Ulrik L. Olsen(Technical University of Denmark), Henning Friis Poulsen(Technical University of Denmark)
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