Adhesion–delamination phenomena at the interfaces of the dielectric layer

Cheng-Tang Pan(National Sun Yat-sen University), W.F. Chen(National Sun Yat-sen University), S.Y. Wang(National Sun Yat-sen University), Shih-Wei Mao(R.O.C Military Academy), Shin‐Pon Ju(National Sun Yat-sen University), Chun Wu(Changsha University of Science and Technology), C.K. Yen(National Sun Yat-sen University), Jialin Wu(National Sun Yat-sen University)
Results in Physics
July 28, 2020
Cited by 12


Related Papers