Ni–Li anti-site defect induced intragranular cracking in Ni-rich layer-structured cathode
Qingyun Lin(Zhejiang University), Ze Zhang(Zhejiang University), Jixue Li(State Key Laboratory of Silicon Materials), Jie Meng(Zhejiang University), Tao Chen(University of Chinese Academy of Sciences), Yuewu Zeng(Zhejiang University), Wei Huang(Zhejiang University), Xiao Wei(Zhejiang University), Jianbin Zhou(University of California San Diego), Wenhao Guan(Zhejiang University), Qiang Gao(Hefei University of Technology)
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