Parasitic Resistance Effect Analysis in RRAM-based TCAM for Memory Augmented Neural Networks

Yan Liao(Tsinghua University), He Qian(University of Science and Technology of China), Shuguang Cui(Chinese University of Hong Kong, Shenzhen), Huaqiang Wu(Beijing Advanced Sciences and Innovation Center), Peng Yao(Tsinghua University), Xinyi Li(Institute of Microelectronics), Wenqiang Zhang(Tsinghua University), Jianshi Tang(Tsinghua University), Zhen Li(Qilu University of Technology), Bin Gao(Chinese Academy of Sciences)
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