Investigation of dimensionality in superconducting NbN thin film samples with different thicknesses and NbTiN meander nanowire samples by measuring the upper critical field*

Mudassar Nazir(Chinese Academy of Sciences), Dongning Zheng(Chinese Academy of Sciences), Lixing You(Shanghai Institute of Microsystem and Information Technology), Yirong Jin(Ricoh (Japan)), Pengtao Song(Chinese Academy of Sciences), Xiaoyan Yang(Chinese Academy of Sciences), Zhan Wang(Chinese Academy of Sciences), Zhongcheng Xiang(Chinese Academy of Sciences), Huanfang Tian(Chinese Academy of Sciences), Xueyi Guo(Central South University)
Chinese Physics B
May 28, 2020
Cited by 12


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