Peak Force Infrared–Kelvin Probe Force Microscopy

Devon S. Jakob(National Institute of Standards and Technology), Xiaoji G. Xu(Lehigh University), Yong Yan(New Jersey Institute of Technology), Daniel E. Otzen(Aarhus University), Haomin Wang(California Institute of Technology), Guanghong Zeng(DHI)
Angewandte Chemie International Edition
May 28, 2020
Cited by 37


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