A Reliability-Aware Joint Design Method of Application Mapping and Wavelength Assignment for WDM-Based Silicon Photonic Interconnects on Chip

Hui Li(Yanshan University), Xiaochun Ye(Huazhong Agricultural University), Zhuqin Chu(Xidian University), Huaxi Gu(Xidian University), Feiyang Liu(National University of Defense Technology)
IEEE Access
January 1, 2020
10.1109/access.2020.2987928
Cited by 7

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