Physical evaluation of an ultra-high-resolution CT scanner
Luuk J. Oostveen(Radboud University Nijmegen), Ioannis Sechopoulos(Radboud University Nijmegen), Monique Brink(Radboud University Nijmegen), Mathias Prokop(Radboud University Nijmegen), Frank de Lange(Martin Luther University Halle-Wittenberg), Kirsten Boedeker(Canon (Japan))
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