Subtraction method via phase mask enables contrast enhancement in scanned Bessel light-sheet microscopy

Suhui Deng(Nanchang University), Mingping Liu(Nanchang University), Huilin Zhou(Nanjing University of Posts and Telecommunications), Jianzhong Yang(Chinese Academy of Sciences), Peng Wang(University of Cincinnati), Yulong Zhang(South China Agricultural University)
Journal of the Optical Society of America A
December 11, 2019
Cited by 4


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