Improvement of Alternative Non-Raster Scanning Methods for High Speed Atomic Force Microscopy: A ReviewSajal K. Das(Rajshahi University of Engineering and Technology), N. PaulIEEE AccessJanuary 1, 201910.1109/access.2019.2936471Cited by 34SaveCiteExport RISWatch citationsRelated PapersEnhancing solar cell efficiency: Investigation of high-performance lead-based perovskite-on-silicon (PVK–Si) tandem solar cells through design and numerical analysis|AIP Advances|2024|19