An indirectly stimulated emission depletion method for STED microscopy
Zhijun Luo(Union Hospital), Changsheng Xie(Wuhan National Laboratory for Optoelectronics), Yanan Liu(Ministry of Education of the People's Republic of China), Zongsong Gan(Zhejiang Ocean University), Menglin Chen(Aarhus University)
Cited by 0
Related Papers
Three-dimensional deep sub-diffraction optical beam lithography with 9 nm feature size
|Nature Communications|2013|556
Biomimetic gyroid nanostructures exceeding their natural origins
|Science Advances|2016|164
Fiber-tip polymer clamped-beam probe for high-sensitivity nanoforce measurements
|Light Science & Applications|2021|161