Investigation of Multi-Plane Scheme for Compensation of Fringe Effect of Electrical Resistance Tomography Sensor
Wenbin Tian(Beijing Advanced Sciences and Innovation Center), Wuqiang Yang(University of Manchester), Jiangtao Sun(Beihang University), Xiaolei Qu(Beihang University), Shuo Gao(Beihang University), Xiaofeng Liang(Beijing Advanced Sciences and Innovation Center), Lijun Xu(China Institute of Atomic Energy)
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