CTFFIND4: Fast and accurate defocus estimation from electron micrographs

Alexis Rohou(Helix (United States)), Nikolaus Grigorieff(Helix (United States))

Journal of Structural Biology

August 13, 2015

10.1016/j.jsb.2015.08.008

Cited by 5,563Open Access

Abstract

Related Papers

Accurate determination of local defocus and specimen tilt in electron microscopy

Joseph A. Mindell, Nikolaus Grigorieff|Journal of Structural Biology|2003|1.4k

A New Generation of the IMAGIC Image Processing System

Marin van Heel, George Harauz, Elena V. Orlova et al.|Journal of Structural Biology|1996|1.2k

A Primer to Single-Particle Cryo-Electron Microscopy

Yifan Cheng, Nikolaus Grigorieff, Pawel A. Penczek et al.|Cell|2015|594

Single-particle electron cryo-microscopy: towards atomic resolution

Marin van Heel, Brent Gowen, Rishi Matadeen et al.|Quarterly Reviews of Biophysics|2000|589

Volta potential phase plate for in-focus phase contrast transmission electron microscopy

Radostin Danev, Bart Buijsse, Maryam Khoshouei et al.|Proceedings of the National Academy of Sciences|2014|517