Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs
Wang Liao(The University of Osaka), Yasuhiro Miyake(High Energy Accelerator Research Organization), Yukinobu Watanabe(Kyushu University), Soshi Takeshita(High Energy Accelerator Research Organization), M. Tampo(Kansai Institute for Photon Science), Keita Nakano(Kyushu University), H. Takeshita(Kyushu University), Masanori Hashimoto(The University of Osaka), Shinichiro Abe(Japan Atomic Energy Agency), Seiya Manabe(Kyushu University)
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