Characterising the strain in a twisted nanowire by scanning electron diffraction

Alexander S. Eggeman(University of Manchester), Paul A. Midgley(University of Cambridge), Caterina Ducati(University of Cambridge), Luiz H. G. Tizei(Université Paris-Sud), M. A. Cotta(Universidade Estadual de Campinas (UNICAMP)), D. Ugarte(Universidade Estadual de Campinas (UNICAMP))
Acta Crystallographica Section A Foundations and Advances
August 22, 2018
Cited by 0


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