A new method using machine learning for automated image analysis applied to chip-based digital assays

Tong Gou(State Key Laboratory of Industrial Control Technology), Ying Mu(State Key Laboratory of Industrial Control Technology), Haotian Shen(ITRI International), Zhenming Hu(The Affiliated Yongchuan Hospital of Chongqing Medical University), Shufang Zhou(Zhejiang University), Jingjing Sun(ITRI International), Weibo Fang(State Key Laboratory of Industrial Control Technology), Jiumei Hu(Johns Hopkins University), Wenshuai Wu(Nanyang Technological University)
The Analyst
January 1, 2019
Cited by 26


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