25.2 A Reconfigurable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source With &lt;6×10<sup>−6</sup> Native Bit Error Rate

Yachuan Pang(Tsinghua University), Huaqiang Wu(Beijing Advanced Sciences and Innovation Center), Shengyu Yi(Tsinghua University), Qi Liu(Tsinghua University), Shimeng Yu(Georgia Institute of Technology), Xiaoyu Sun(Georgia Institute of Technology), Wei-Hao Chen(Chongqing University), He Qian(University of Science and Technology of China), Dong Wu(Tsinghua University), Ting-Wei Chang(National Taiwan University), Bin Gao(Chinese Academy of Sciences), Wei-En Lin(National Tsing Hua University), Meng‐Fan Chang(Taiwan Semiconductor Manufacturing Company (Taiwan))
Unknown
February 1, 2019
10.1109/isscc.2019.8662307
Cited by 66

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